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In-situ biasing of semiconducting NWs in transmission electron microscopy: doping quantification and contact formation
1 : Institut NEEL/CNRS
Institut NEEL-CNRS
25 avenue des Martyrs, 38042 Grenoble, France -
France
| Subject : | : | oral |
| Topics | : | MPS2- In operando transmission electron microscopy |
| PDF version | : |  PDF version |
